📄️ Continuity Test
Continuity test contains open/short test and power pin short test. The former checks the signal pins, while the latter checks the power pin.
📄️ DC Parameters
Testing DC parameters is essentially measuring the resistivity of the silicon. They can be tested DC method, with DCVI/PPMU forcing current then measuring voltage, or forcing voltage then measuring current. Will compare the measured value with the spec value out of the tester, then conclude a test result with PASS or FAIL. Items can be tested under DC method are as follows:
📄️ IDD Test
Power supply current (IDD) indicates the current flows from Drain to Drain in a CMOS circuit (named ICC in TTL circuit, means Collector to Collector). IDD can be equivalent as:
📄️ Leakage Test
Leakage test contains input leakage test (IIL & IIH) and output tristate leakage test (IOZL & IOZH).
📄️ Level Threshold Test 🚧
Level threshold test includes Output Level Threshold (VOL & VOH) and Input Level Threshold (VIL & VIH). They are originated from typical TTL and CMOS level threshold:
📄️ Digital Functional Test 🚧
References & Acknowledgements